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- 4th International SAXS/GISAXS Workshop (PDF)
Sep 09-11, Leoben, Austria - Navigated Atomic Force Microscopy - N8 NEOS
Sep 15, Free Webinar - 17th Bruker Users‘ Group Meetings 2010 - Single Crystal X-ray Diffraction
Sep 19-22, Karlsruhe, Germany - Good Diffraction Practice III - Powder XRD Instrumentation and Data Quality
Sep 30, Free Webinar - COM2010 - Conference of Metallurgists
Oct 03-06, Vancouver, British Columbia, Canada
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X-ray Detectors
Bruker AXS as a leading supplier of X-ray analytical equipment treats detector technology as one of the most important topics for the enhancement of capabilities in materials analysis. Therefore, in close cooperation with research Bruker AXS drives detector technology further and further, offering now a wide range of detectors for various applications and requirements.
For sure the industrial standard detectors such as scintillation counters and proportional counters are part of the product range. Also, silicon technology was used to develop detectors with outstanding capabilities for X-ray diffraction and fluorescence analysis. This includes the large active area, energy dispersive SOL-XE detector for XRD, and the high count rate capable silicon drift detector for XRF, or the 1-dimensional compound silicon strip LYNXEYETM detector for super speed XRD experiments.
Furthermore, 1- and 2-dimensional detectors of the VÅNTEC family providing proprietary and patented MikrogapTM technology for super speed and super sensible X-ray diffraction or scattering work offer an analytical advantage for the user.
More Information
VÅNTEC-1 - Detector for super speed X-ray diffraction (PDF spec sheet)
SOL-XE energy dispersive x-ray detector (PDF spec sheet)
LYNXEYE - Super speed detector for X-ray powder diffraction (PDF spec sheet)

