Webinars

Developments in quantitative EDS analysis with a focus on light element and low energy peaks

Quantitative EDS analysis has become a standard method in the characterization of samples in the electron microscope. The software shipped with modern energy dispersive spectrometry systems provides good results in automatic analysis modes with little user interaction for many routine applications.

However, there may be cases where less satisfactory or even wrong results are obtained. This can have a number of different causes, most common are element peak overlaps, and – nowadays of increasing importance – the necessity to analyze the peaks of elements at low energies. The latter mainly results from the desire to improve spatial resolution of bulk sample EDS analyses by reducing the accelerating voltage of the scanning electron microscope. Thanks to the efficiency and energy resolution of state-of-the-art EDS detectors, analysis of specimens at accelerating voltages of 5 kV or lower within reasonable time has become possible. View webinar Developments in quantitative EDS analysis

Revolutionizing EDS analysis on TEMs using silicon drift detectors

Silicon drift detectors are a well established analytical technology on scanning electron microscopes. Bruker AXS Microanalysis, as the technological leader in this field, is the first company that has adapted SDDs for optimal operation on transmission electron microscopes. View webinar Revolutionizing EDS analysis on TEMs using silicon drift detectors

Challenges in Nanoanalysis

Continuing technological advances require the elemental analysis of increasingly smaller structures in many industrial fields, including biological applications,  semiconductors, and nanotechnology in general. This confronts the otherwise well proven electron microscope based energy dispersive spectroscopy with new  challenges.
View webinar Challenges in Nanoanalysis

Practical Spectrum Imaging: Rapid Collection for Routine Analysis

The ability to quickly and accurately map element distribution over a sample area has become essential to material analysts involved with QA/QC, forensics, art conservation, and other scientific disciplines. High-speed X-ray detectors, coupled with powerful Spectrum Imaging tools, now automatically extract composition information in minutes, making X-ray microanalysis techniques practical for even routine applications.
View webinar Practical Spectrum Imaging: Rapid Collection for Routine Analysis