Read testimonial by Dr. Heinemann (Friedrich-Alexander-University, Erlangen-Nuremberg, Germany): "In 1987 the Institute of Inorganic Chemistry of the Friedrich-Alexander University Erlangen-Nuremberg established single crystal X-ray structure determination as a routine method using a NICOLET R3m/V diffractometer, which was followed by two SIEMENS P4 (1992) and a Bruker Nonius KAPPA CCD (2001). Although CCD technology enabled us to measure much smaller and weakly diffracting crystals, we are dealing with even more challenging samples these days. After a careful investigation of available microfocus sealed tube systems we decided to continue our successful partnership with Bruker and bought an APEX DUO."

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- At EPDIC 12 Dr. Hugo Rietveld was granted the EPDIC Award for Distinguished Powder Diffractionists
- D2 PHASER with XFlash® Detector - Combined XRD, EDXRD, and XRF analysis
- Bruker Announces Agreement to Acquire Veeco's
- Prof. David C. Joy wins 2010 Duncumb Award for Excellence in Microanalysis
- Bruker Receives Contract from National Institute of Standards and Technology (NIST) for N8 TITANOS
- 4th International SAXS/GISAXS Workshop (PDF)
Sep 09-11, Leoben, Austria - Navigated Atomic Force Microscopy - N8 NEOS
Sep 15, Free Webinar - 17th Bruker Users‘ Group Meetings 2010 - Single Crystal X-ray Diffraction
Sep 19-22, Karlsruhe, Germany - Good Diffraction Practice III - Powder XRD Instrumentation and Data Quality
Sep 30, Free Webinar - COM2010 - Conference of Metallurgists
Oct 03-06, Vancouver, British Columbia, Canada


