Instrumentation for the Analyis in the Nano-world

Bruker Nano is a leading manufacturer of analytical instrumentation for analysis at highest spatial resolution.

QUANTAX EDS for SEM and S/TEM

Bruker's unique QUANTAX systems for X-ray microanalysis (EDS) on scanning electron microscopes (SEM) and (scanning) transmission electron microscopes (S/TEM) are leading in performance for all tasks in elemental analysis.

QUANTAX Electron Backscatter Diffraction (EBSD)

The QUANTAX CrystAlign EBSD system is fully integrated with the QUANTAX EDS system under a single user interface and therefore comfortable and easy to use. The e^-Flash¹⁰⁰⁰ EBSD detector is extremely fast and at the same time offers great flexibilty in measurement setup through the in-situ tilt option, including simultaneous EDS and EBSD measurement.

µ-XRF - Micro X-ray fluorescence spectrometry

Micro X-ray fluorescence spectrometry (µ-XRF ) is the method of choice for elemental analysis with X-ray excitation and high spatial resolution. What distinguishes µ-XRF from standard X-ray fluorescence spectrometry is that the tube-generated X-ray beam is either collimated or focused to spot sizes ranging from 25 to 2,000 µm.

M1 MISTRAL
Tabletop µ-XRF spectrometer for fast jewelry and alloy analysis

M1 ORA
The ultra-compact tabletop jewelry analysis system

M4 TORNADO
Fast and versatile 2D µ-XRF spectrometer with vacuum
sample chamber

ARTAX
2D µ-XRF spectrometer for the analysis of works of art

Atomic Force Microscopy (AFM)

The NANOS N8 series of instruments for atomic force / scanning probe microscopy AFM/SPM feature the unique NANOS measurement head that approximates an optical microscope objective in size and shape. This enables alignment-free AFM and optical microscopy including unobstructed sample viewing.