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Upcoming Events
- ACS Fall
Aug 22-26, Boston, Massachusetts, USA - 3rd EuCheMS Chemistry Congress
Aug 29-Sep 02, Nuremberg, Germany - 4th International SAXS/GISAXS Workshop (PDF)
Sep 09-11, Leoben, Austria - Navigated Atomic Force Microscopy - N8 NEOS
Sep 15, Free Webinar - 17th Bruker Users‘ Group Meetings 2010 - Single Crystal X-ray Diffraction (PDF)
Sep 20-22, Karlsruhe, Germany
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Instrumentation for the Analyis in the Nano-world
Bruker Nano is a leading manufacturer of analytical instrumentation for analysis at highest spatial resolution.
QUANTAX EDS for SEM and S/TEM
Bruker's unique QUANTAX systems for X-ray microanalysis (EDS) on scanning electron microscopes (SEM) and (scanning) transmission electron microscopes (S/TEM) are leading in performance for all tasks in elemental analysis.
QUANTAX Electron Backscatter Diffraction (EBSD)
The QUANTAX CrystAlign EBSD system is fully integrated with the QUANTAX EDS system under a single user interface and therefore comfortable and easy to use. The e-Flash1000 EBSD detector is extremely fast and at the same time offers great flexibilty in measurement setup through the in-situ tilt option, including simultaneous EDS and EBSD measurement.
µ-XRF - Micro X-ray fluorescence spectrometry
Micro X-ray fluorescence spectrometry (µ-XRF ) is the method of choice for elemental analysis with X-ray excitation and high spatial resolution. What distinguishes µ-XRF from standard X-ray fluorescence spectrometry is that the tube-generated X-ray beam is either collimated or focused to spot sizes ranging from 25 to 2,000 µm.
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M1 MISTRAL Tabletop µ-XRF spectrometer for fast jewelry and alloy analysis |
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M1 ORA The ultra-compact tabletop jewelry analysis system |
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M4 TORNADO Fast and versatile 2D µ-XRF spectrometer with vacuum sample chamber |
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ARTAX 2D µ-XRF spectrometer for the analysis of works of art |
Atomic Force Microscopy (AFM)
The NANOS N8 series of instruments for atomic force / scanning probe microscopy AFM/SPM feature the unique NANOS measurement head that approximates an optical microscope objective in size and shape. This enables alignment-free AFM and optical microscopy including unobstructed sample viewing.
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NANOS Upgrade your existing optical microscope to an AFM |
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N8 ARGOS The compact AFM/SPM for research and education |
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N8 NEOS Research grade optical microscope and AFM combination |
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N8 RADOS The perfect tool for automated optical & AFM sample inspection |
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N8 TITANOS Automated large sample AFM platform |
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NEOS SENTERRA Combined AFM and Raman spectrometer |
Your are also welcome to use our general information request form to obtain additional information.











