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- 4th International SAXS/GISAXS Workshop (PDF)
Sep 09-11, Leoben, Austria - Navigated Atomic Force Microscopy - N8 NEOS
Sep 15, Free Webinar - 17th Bruker Users‘ Group Meetings 2010 - Single Crystal X-ray Diffraction
Sep 19-22, Karlsruhe, Germany - Good Diffraction Practice III - Powder XRD Instrumentation and Data Quality
Sep 30, Free Webinar - COM2010 - Conference of Metallurgists
Oct 03-06, Vancouver, British Columbia, Canada
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N8 NEOS SENTERRA
- N8 NEOS SENTERRA
The N8 NEOS SENTERRA is the new combination of the most flexible N8 NEOS Scanning Probe Microscope with Bruker's SENTERRA Raman microscope.
Combined AFM and Raman microscopy
The instrument provides high resolution topography measurements at the molecular level with the capability to perform chemical analysis by Raman spectroscopy.
N8 NEOS SENTERRA facilitates to study the region of interest of any sample by AFM and Raman subsequently, without a dislocation of the sample in-between. Many different laser excitation lines are available for the SENTERRA which provides a very high sensitivity and wavelength stability.