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- 4th International SAXS/GISAXS Workshop (PDF)
Sep 09-11, Leoben, Austria - Navigated Atomic Force Microscopy - N8 NEOS
Sep 15, Free Webinar - 17th Bruker Users‘ Group Meetings 2010 - Single Crystal X-ray Diffraction
Sep 19-22, Karlsruhe, Germany - Good Diffraction Practice III - Powder XRD Instrumentation and Data Quality
Sep 30, Free Webinar - COM2010 - Conference of Metallurgists
Oct 03-06, Vancouver, British Columbia, Canada
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MULTEX
- MULTEX Software
MULTEX is an easy-to-use software for the entire process of texture investigation. It features planning of measurement strategies, calculating and analysing of pole figures. For data obtained with a 2-D detector also an extended background handling is available to treat data containing diffraction lines that are simultaneously measured. Pole figures can be exported for further analysis using ODF.