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- At EPDIC 12 Dr. Hugo Rietveld was granted the EPDIC Award for Distinguished Powder Diffractionists
- D2 PHASER with XFlash® Detector - Combined XRD, EDXRD, and XRF analysis
- Bruker Announces Agreement to Acquire Veeco's
- Prof. David C. Joy wins 2010 Duncumb Award for Excellence in Microanalysis
- Bruker Receives Contract from National Institute of Standards and Technology (NIST) for N8 TITANOS
- 4th International SAXS/GISAXS Workshop (PDF)
Sep 09-11, Leoben, Austria - Navigated Atomic Force Microscopy - N8 NEOS
Sep 15, Free Webinar - 17th Bruker Users‘ Group Meetings 2010 - Single Crystal X-ray Diffraction
Sep 19-22, Karlsruhe, Germany - Good Diffraction Practice III - Powder XRD Instrumentation and Data Quality
Sep 30, Free Webinar - COM2010 - Conference of Metallurgists
Oct 03-06, Vancouver, British Columbia, Canada
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Management Team
Frank H. Laukien, Ph.D.
President and CEO, Bruker Corporation
Dr. Frank Burgäzy
Co-President, Bruker AXS Inc.
Managing Director, Bruker AXS GmbH
Bernard Kolodziej
President, Bruker Elemental GmbH
Managing Director, Bruker AXS GmbH
Thomas Schülein
Co-President, Bruker AXS Inc.
Managing Director, Bruker Nano GmbH
Stephan Westermann
CFO, Bruker AXS Inc.
Managing Director, Bruker AXS GmbH
Roger Durst, Ph.D.
Executive Vice President, Bruker AXS Inc.
CTO, Bruker AXS Inc.
John Landefeld
Vice President, Bruker AXS Inc.
Managing Director, Bruker AXS Handheld Inc.
Dr. Frank Saurenbach
Vice President, Bruker AXS Inc.
Bernd Masling
Director Sales, Bruker AXS GmbH
Sadao Ueki
President, Bruker AXS K.K.
Kline Wilkins
Senior Vice President, Bruker AXS Inc.