X-ray Diffraction

X-Ray Diffraction (XRD) is a high-tech, non-destructive technique for analyzing a wide range of materials, including fluids, metals, minerals, polymers, catalysts, plastics, pharmaceuticals, thin-film coatings, ceramics, solar cells and semiconductors. Throughout industry and research institutions, XRD has become an indispensable method for materials investigation, characterization and quality control. Example areas of application include qualitative and quantitative phase analysis, crystallography, structure and relaxation determination, texture and residual stress investigations, controlled sample environment, micro-diffraction, nano-materials, lab- and process automation, and high-throughput polymorph screening.

Bruker AXS is the worldwide leading supplier for advanced X-ray diffraction solutions. Continual innovation in X-ray sources, optics, detectors, software and sample handling ensures that Bruker AXS is able to offer a Diffraction Solution for virtually any kind of X-ray analytical task. In addition, the Bruker AXS XRD systems are all built on the common D8 platform, which ensures modularity for future upgrades or downgrades of the system. For conditioning the incident beam, a wide range of interchangeable optics is available.

Sample handling is virtually unlimited: sample spinners, temperature and humidity chambers, 5-degree of freedom motion control, or 300 mm automated wafer handling is all available on the D8 platform. On the detector side, point, 1-dimensional and 2-dimensional XRD2 detectors can be optimized for the analytical task at hand. The DIFFRAC^plus and the DIFFRAC.SUITE software provide a common look and feel for measurement and analysis software. Amongst them is leading-edge technology, like DIFFRAC^plus TOPAS, the latest generation Total Pattern Analysis Rietveld software. Expert and professional application, sales, training and service are in place to support the customer.