
Language
Search
Product News
- POLYSNAP V3: Automated High-Throughput Data Analysis & Visualization
- Lab Report XRF 95 S8 TIGER WDXRF performance test according to ISO 9516-1:2003
- Lab Report XRD 72 Proactive Blockage Prevention in cement production by quantitative Hotmeal phase analysis
- Bruker Nano Attains Atomic Resolution with N8 TITANOS™ Large Sample Atomic Force Microscope (AFM)
- Application Report XRD 11 D2 PHASER Desktop XRD: Quantitative phase analysis of Gypsum/Anhydrite samples
Upcoming Events
- nano tech
Feb 17-19, Tokyo, Japan - AXS CEM 2010 (PDF)
Feb 22-23, Karlsruhe, Germany - Analytica
March 23-26, Munich, Germany - BCA
April 12-15, Warwick, Great Britain
![]() |
D8 DISCOVER with GADDS
Anyone whose day-to-day work involves pushing the limits of analytical research and science is dependent on instrumentation that can handle changing requirements.
The flexibility of a diffractometer to handle it all: smallest and largest samples and sample amounts, inhomogeneous or oriented samples of complex shape geometry and possibly with heavy weight is very often the key to be able to perform any analysis at all on a sample.
The D8 DISCOVER with GADDS combines cutting edge x-ray technology of the highest quality in a truly modular system. The D8 DISCOVER with GADDS can analyze an unrivaled variety of samples within a wide range of XRD2 and SAXS applications.
The D8 DISCOVER with GADDS illuminates samples with a tuned monochromatic and parallel x-ray beam. The spatially diffracted x-rays are then measured and evaluated using software from Bruker’s GADDS suite.
Key hardware components of the D8 DISCOVER with GADDS are the patented automated Laser-Video alignment system and the patented HI-STAR area detector:
Both components enable simple precision alignment of sample features for instant analysis in snap-shot or movie mode. Peak to back-ground of the data are close to the theoretical limits because of the unique sensitivity of the HI-STAR detector.
Many high-end accessories are available to accommodate applications ranging from Phase Identification, Phase quantification, Texture, Stress, Single Crystal Diffraction, Small Angle X-ray Scattering, High Throughput Screening, MicroDiffraction, Mapping, Reciprocal Space Mapping, Non Ambient Characterization, High resolution X-ray Diffraction, Reflectometry, Gracing Incidence Diffraction, Indexing and Structure Solution.


