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- 4th International SAXS/GISAXS Workshop (PDF)
Sep 09-11, Leoben, Austria - Navigated Atomic Force Microscopy - N8 NEOS
Sep 15, Free Webinar - 17th Bruker Users‘ Group Meetings 2010 - Single Crystal X-ray Diffraction
Sep 19-22, Karlsruhe, Germany - Good Diffraction Practice III - Powder XRD Instrumentation and Data Quality
Sep 30, Free Webinar - COM2010 - Conference of Metallurgists
Oct 03-06, Vancouver, British Columbia, Canada
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The new N8 NEOS
- The new N8 NEOS
- Navigated AFM with atomic resolution
The N8 NEOS is the first optical microscope to demonstrate atomic scale resolution in combination with Atomic Force Microscopy (AFM/SPM). As today’s most advanced navigated AFM, the N8 NEOS provides a seamless workflow for investigating samples from low over high optical resolution to the ultimate magnification possible. The system provides superb microscopy optics, e.g. bright/darkfield observation, or differential interference contrast (DIC), with the perfectly integrated NANOS AFM for the efficient sample inspection.
Navigated AFM with atomic resolution
The N8 NEOS is the most intuitive AFM on the market. Operated like a classical optical microscope, small objects, single defects or structures can easily be identified and localized. Eventually, the objective-sized NANOS can be engaged just by another turn of the revolving nosepiece. Within seconds, the measurement is started with the AFM probe in perfect position.
N8 NEOS Features
- Atomic resolution on HOPG, Z < 0.05 nm
- Resolution from the millimeter to the sub-nanometer level
- Easy AFM navigation by using optical microscopy techniques
- Interferometric AFM – calibrated and reproducible results
- Complete range of AFM modes, e.g. non-contact, Kelvin Probe, nanolithography, etc.
- Reinforced nosepiece and vertical stage for precise positioning
- Modular and upgradeable