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- 4th International SAXS/GISAXS Workshop (PDF)
Sep 09-11, Leoben, Austria - Navigated Atomic Force Microscopy - N8 NEOS
Sep 15, Free Webinar - 17th Bruker Users‘ Group Meetings 2010 - Single Crystal X-ray Diffraction
Sep 19-22, Karlsruhe, Germany - Good Diffraction Practice III - Powder XRD Instrumentation and Data Quality
Sep 30, Free Webinar - COM2010 - Conference of Metallurgists
Oct 03-06, Vancouver, British Columbia, Canada
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DIFFRACplus TOPAS P
- DIFFRACplus TOPAS P
For applications, which do not require the full features of TOPAS, an additional variant has been developed: TOPAS P.
TOPAS P is designed for profile analysis of powder data without reference to a crystal structure model. This includes Single Line Fitting up to Whole Powder Pattern Fitting, Whole Powder Pattern Decomposition (Pawley and LeBail methods), and Indexing (LSI-Index and LP-Search methods).
Applications include
- Determination of accurate profile parameters (line positions, integrated intensities, peak widths and shapes)
- Standardless microstructure analysis
- Lattice parameter refinement