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Product News
- Bruker Nano Publishes TXRF Training Package for Academia
- Bruker Receives Contract from National Institute of Standards and Technology (NIST) for N8 TITANOS
- Bruker Nano Introduces the New N8 NEOS
- Bruker AXS Microanalysis GmbH renamed Bruker Nano GmbH
- Bruker Nano Attains Atomic Resolution with N8 TITANOS™ Large Sample Atomic Force Microscope (AFM)
Upcoming Events
- ACS Fall
Aug 22-26, Boston, Massachusetts, USA - 3rd EuCheMS Chemistry Congress
Aug 29-Sep 02, Nuremberg, Germany - 4th International SAXS/GISAXS Workshop (PDF)
Sep 09-11, Leoben, Austria - Navigated Atomic Force Microscopy - N8 NEOS
Sep 15, Free Webinar - 17th Bruker Users‘ Group Meetings 2010 - Single Crystal X-ray Diffraction (PDF)
Sep 20-22, Karlsruhe, Germany
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Operation
- N8 NEOS
Designed to provide most intuitive operation, the N8 AFM series works similarly to an optical microscope and is controlled by a clearly-structured user interface. No matter whether you want to do standard surface inspection or more specialized applications, a wide range of appropriate measurement modes is available.