Free Webinar Navigated Atomic Force Microscopy - N8 NEOS

Atomic Force Microscopy has become an established tool in nanoscience and technology. The high sensitivity of instruments requires a design that provides maximum stability and resolution. Therefore, most of the available AFMs are pure stand-alone configurations. These have limited viewing options or work only on transparent samples with less than optimal resolution, as is the case in combination with inverted optical microscopes.

The N8 NEOS is the first high performance AFM with the look and feel of an upright optical microscope. The truly seamless integration of the two methods combines both, fast sample navigation and optimum resolution. This webinar will highlight the unique features and upgrade options that make the N8 NEOS a versatile and efficient surface inspection tool. Various applications will demonstrate the advantages of a navigated AFM even on samples hardly accessible with conventional instruments.