Uniques features of the NANOS AFM / SPM products

Bruker Nano supplies AFMs/SPMs that

  •  provide fast and easy navigation

  •  can be operated by users with introductory training only       yet offer all modes and options required for advanced research

  •  use fiber optic interferometry for calibrated cantilever       deflection measurements

  •  cover the range from large scan areas (combined with traceable AFM (optional)) to       highest resolution

  •  can be upgraded with other techniques, e.g. Raman, confocal microscopy

  •  can be combined with your existing optical/confocal/interferometric       microscope, or similar inspection tools

  •  are available in versions for samples up to 300 mm diameter

In short, we have the right solution for your SPM application!