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- 4th International SAXS/GISAXS Workshop (PDF)
Sep 09-11, Leoben, Austria - Navigated Atomic Force Microscopy - N8 NEOS
Sep 15, Free Webinar - 17th Bruker Users‘ Group Meetings 2010 - Single Crystal X-ray Diffraction
Sep 19-22, Karlsruhe, Germany - Good Diffraction Practice III - Powder XRD Instrumentation and Data Quality
Sep 30, Free Webinar - COM2010 - Conference of Metallurgists
Oct 03-06, Vancouver, British Columbia, Canada
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Contact mode AFM
- Contact mode measurement on SnO2, 3 x 3 µm2, max. height: 230 nm
is the most straightforward, basic topography imaging mode of the AFM.
In contact mode, the AFM tip has a direct contact with the sample. While the tip is scanned along the surface, the sample topography induces a vertical deflection of the cantilever. This deflection is measured by a fiber- optical interferometer. An active vertical feedback system maintains a preset load force (= static deflection) on the cantilever.
Contact mode - basis for further SPM techniques
Contact mode is suitable for materials science, biological applications and basic research. It also serves as a basis for further SPM techniques, which require direct tip-sample contact. Contact mode imaging is part of the basic configuration of the NANOS and N8 product series.