Revolutionizing EDS analysis on TEMs using silicon drift detectors

Silicon drift detectors are a well established analytical technology on scanning electron microscopes. Bruker AXS Microanalysis, as the technological leader in this field, is the first company that has adapted SDDs for optimal operation on transmission electron microscopes. The XFlash® 5030 T is Bruker‘s detector for this application. Its design has been optimised to cause no interference with the electron optics of all types of transmission and scanning transmission electron microscopes, including aberration corrected instruments.

    

During this webinar we explained the technology of SDDs and particularly focused on Bruker‘s adaptation to (S)TEM operation. We also introduced the ESPRIT software features for transmission electron microscopy included with Bruker‘s QUANTAX EDS systems. Application examples from materials science were presented to demonstrate the performance of the XFlash® on (S)TEMs.

View a recording of this webinar